Entity 1 & HIT, Taiwan Announce – Red Mud–Based Silicon Carbide Wafers Tested by HIT, Taiwan

Chennai (Tamil Nadu) [India], September 23: Entity 1 Value Emissions Pvt Ltd, India and HIT, Taiwan. Today announces a groundbreaking PoC program: silicon carbide (SiC) wafers produced from red mud-derived silicon, with testing conducted by Taiwan Semiconductor Industry professionals via HIT, Taiwan. This milestone marks India’s emergence as a global innovator in sustainable materials for the semiconductor value chain and reinforces Make in India as a strategic driver for domestic manufacturing.

What’s New • Product: Red mud–derived silicon carbide wafers in testing-grade formats. • Sizes tested: 7×7 mm, 10×10 mm, and 13×13 mm wafers used for PoC testing. • Source material: Silicon derived from red mud, sourced from National Aluminium Company Limited (NALCO); silicon carbide materia